Search results for "Chemical force microscopy"

showing 4 items of 4 documents

Nanoscale Mapping of the Physical Surface Properties of Human Buccal Cells and Changes Induced by Saliva

2019

International audience; The mucosal pellicle, also called salivary pellicle, is a thin biological layer made of salivary and epithelial constituents, lining oral mucosae. It contributes to their protection against microbiological, chemical, or mechanical insults. Pellicle formation depends on the cells’ surface properties, and in turn the pellicle deeply modifies such properties. It has been reported that the expression of the transmembrane mucin MUC1 in oral epithelial cells improves the formation of the mucosal pellicle. Here, we describe an approach combining classical and functionalized tip atomic force microscopy and scanning microwave microscopy to characterize how MUC1 induces change…

Cell typeSalivaSurface Properties[SDV]Life Sciences [q-bio]Cellhuman buccal cells02 engineering and technology010402 general chemistry01 natural sciences[SPI]Engineering Sciences [physics]MicroscopyElectrochemistrymedicineElectric ImpedanceHumansNanotechnologyGeneral Materials ScienceSpectroscopyMUC1hydrophobicity[PHYS]Physics [physics]MouthsalivaChemistryMucinSurfaces and Interfaces021001 nanoscience & nanotechnologyCondensed Matter PhysicsTransmembrane protein0104 chemical sciencesScanning Microwave Microscopy SMMmedicine.anatomical_structureChemical force microscopydielectric propertiesBiophysicsChemical Force Microscopyfuntionalization0210 nano-technologyHydrophobic and Hydrophilic Interactions
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Three-dimensional atomic force microscopy mapping at the solid-liquid interface with fast and flexible data acquisition

2016

We present the implementation of a three-dimensional mapping routine for probing solid-liquid interfaces using frequency modulation atomic force microscopy. Our implementation enables fast and flexible data acquisition of up to 20 channels simultaneously. The acquired data can be directly synchronized with commercial atomic force microscope controllers, making our routine easily extendable for related techniques that require additional data channels, e.g., Kelvin probe force microscopy. Moreover, the closest approach of the tip to the sample is limited by a user-defined threshold, providing the possibility to prevent potential damage to the tip. The performance of our setup is demonstrated …

Kelvin probe force microscopeMaterials sciencebusiness.industryInterface (computing)Nanotechnology02 engineering and technologyConductive atomic force microscopy010402 general chemistry021001 nanoscience & nanotechnology53001 natural sciencesSample (graphics)0104 chemical sciencesOpticsData acquisitionChemical force microscopyMicroscopy0210 nano-technologybusinessInstrumentationFrequency modulationReview of Scientific Instruments
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Model of scanning force microscopy on ionic surfaces.

1995

We present a theoretical model of the scanning force microscope using an atomistic simulation technique for the interaction between a crystalline sample and a tip nanoasperity combined with a semi- empirical treatment of the mesoscopic van der Waals attraction between tip and surface, and the macroscopic parameter of cantilever deflection. For the nanoasperity at the end of the tip, we used a neutral and a protonated (MgO${)}_{32}$ cube, which model a hard tip made of oxide material. Static calculations based on total-energy minimization were used to determine the surface and tip geometries and total energy as a function of tip position. Scan lines of the perfect (001) surfaces of NaCl and …

Mesoscopic physicsMaterials scienceIonic bondingNanotechnologyEdge (geometry)Molecular physicsIonCondensed Matter::Materials ScienceMonatomic ionsymbols.namesakeChemical force microscopysymbolsvan der Waals forceDispersion (water waves)Physical review. B, Condensed matter
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Lateral force microscopy of multiwalled carbon nanotubes

2009

Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotub…

NanotubeMaterials scienceElectrostatic force microscopeAnalytical chemistryAtomic force acoustic microscopyMechanical properties of carbon nanotubesConductive atomic force microscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsChemical force microscopyMagnetic force microscopeComposite materialInstrumentationNon-contact atomic force microscopyUltramicroscopy
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